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P-ISSN: 2618-060X, E-ISSN: 2618-0618   |   NAAS: 5.20

2025, Vol. 8, Issue 4, Part F

Genetic diversity and trait association analysis in wheat (Triticum aestivum L.) genotypes for yield improvement


Sharyou D Shrungarpawar, LS Shitole, NM Magar, Girish U Chopade, TJ Bhor, AA Bhagat and CT Kumbhar

Forty genotypes of bread wheat (Triticum aestivum L.) were evaluated during Rabi 2022-2023 using a randomized block design (RBD) with three replications to assess yield and yield-contributing traits. The study aimed to estimate genetic variability, heritability, and genetic advance as a percent of the mean. Significant genetic differences were observed for all quantitative traits, indicating a considerable amount of variation among the genotypes.
For all traits analyzed, the phenotypic coefficient of variation (PCV) marginally exceeded the genotypic coefficient of variation (GCV), suggesting the influence of environmental factors. High GCV and PCV were recorded for grain yield per plant, number of productive tillers per plant, and spike length, whereas other traits exhibited moderate to low estimates. High heritability coupled with high genetic advance was observed for grain yield, number of productive tillers, and spike length. Moderate heritability was noted for 1000 grain weight, flag leaf length, and flag leaf breadth, which also showed substantial genetic advance.
Grain yield per plant exhibited highly significant positive correlations with 1000 grain weight, flag leaf breadth, and number of grains per spike, and significant positive correlations with flag leaf length, number of productive tillers, and spike length. Path coefficient analysis revealed that number of grains per spike and 1000 grain weight had the highest direct effects on grain yield, making them key traits for selection in superior genotypes.
Genetic divergence analysis grouped the 40 genotypes into five clusters. Cluster I contained the maximum number of genotypes (32), followed by Cluster III (4) and Cluster IV (2). Clusters II and V each included only one genotype. The highest inter-cluster distance was observed between Clusters II and V (499.87), and the lowest between Clusters I and IV (52.36). Cluster V recorded the highest cluster mean for grain yield per plant (45.90 g), while Cluster II recorded the lowest (22.43 g). Based on inter-cluster distances, cluster means, per se performance, and divergence classes, the identified genotypes offer promising potential for use in hybridization programs aimed at improving wheat yield.
Pages : 433-439 | 180 Views | 68 Downloads


International Journal of Research in Agronomy
How to cite this article:
Sharyou D Shrungarpawar, LS Shitole, NM Magar, Girish U Chopade, TJ Bhor, AA Bhagat, CT Kumbhar. Genetic diversity and trait association analysis in wheat (Triticum aestivum L.) genotypes for yield improvement. Int J Res Agron 2025;8(4):433-439. DOI: 10.33545/2618060X.2025.v8.i4f.2808
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